![](/img/cover-not-exists.png)
A comparison of HREM and weak beam transmission electron microscopy for the quantitative measurement of the thickness of ferroelectric domain walls
Foeth, M., Sfera, A., Stadelmann, P., Buffat, P.-A.Volume:
48
Language:
english
Journal:
Journal of Electron Microscopy
DOI:
10.1093/oxfordjournals.jmicro.a023740
Date:
January, 1999
File:
PDF, 6.28 MB
english, 1999