[IEEE 2015 International Conference on Optoelectronics and Microelectronics (ICOM) - Changchun, China (2015.7.16-2015.7.18)] 2015 International Conference on Optoelectronics and Microelectronics (ICOM) - Study on measurement method of luminous intensity based on the third generation low light level image intensifier
Rui, Wang, Xiao-feng, Bai, Rui, Wang, Xiao-feng, BaiYear:
2015
Language:
english
DOI:
10.1109/ICoOM.2015.7398864
File:
PDF, 195 KB
english, 2015