[IEEE 2015 IEEE 24th Asian Test Symposium (ATS) - Mumbai, India (2015.11.22-2015.11.25)] 2015 IEEE 24th Asian Test Symposium (ATS) - Diagnostic Tests and Diagnosis for Delay Faults Using Path Segmentation
Flenker, Tino, Sulflow, Andre, Fey, GoerschwinYear:
2015
Language:
english
DOI:
10.1109/ats.2015.32
File:
PDF, 212 KB
english, 2015