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[IEEE 2010 International Conference on Computer, Mechatronics, Control and Electronic Engineering (CMCE 2010) - Changchun, China (2010.08.24-2010.08.26)] 2010 International Conference on Computer, Mechatronics, Control and Electronic Engineering - Research on contrast experiment of metering device simulation design based on DEM

Yu Jianqun,, Yan Hui,, Fu Hong,
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Year:
2010
Language:
english
DOI:
10.1109/cmce.2010.5609986
File:
PDF, 1.14 MB
english, 2010
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