[IEEE 2010 International Conference on Computer, Mechatronics, Control and Electronic Engineering (CMCE 2010) - Changchun, China (2010.08.24-2010.08.26)] 2010 International Conference on Computer, Mechatronics, Control and Electronic Engineering - Influences of different excitation parameters upon PEC testing for deep-layered defect detection with rectangular sensor
Hu, Xiangchao, Luo, FeiluYear:
2010
Language:
english
DOI:
10.1109/cmce.2010.5610253
File:
PDF, 1.08 MB
english, 2010