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[IEEE 2014 51st ACM/EDAC/IEEE Design Automation Conference (DAC) - San Francisco, CA, USA (2014.6.1-2014.6.5)] 2014 51st ACM/EDAC/IEEE Design Automation Conference (DAC) - On using implied values in EDT-based test compression
Gebala, Marcin, Mrugalski, Grzegorz, Mukherjee, Nilanjan, Rajski, Janusz, Tyszer, JerzyYear:
2014
Language:
english
DOI:
10.1109/dac.2014.6881338
File:
PDF, 621 KB
english, 2014