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[IEEE 2015 37th Electrical Overstress/Electrostatic Discharge Symposium (EOS/ESD) - Reno, NV, USA (2015.9.27-2015.10.2)] 2015 37th Electrical Overstress/Electrostatic Discharge Symposium (EOS/ESD) - Self-ESD-protected transmission line broadband in CMOS28nm UTBB-FDSOI
Bourgeat, Johan, Lim, Tekfouy, Heitz, Boris, Jimenez, Jean, Galy, PhilippeYear:
2015
Language:
english
DOI:
10.1109/eosesd.2015.7314805
File:
PDF, 787 KB
english, 2015