[IEEE 2014 International Conference on Reliability, Maintainability and Safety (ICRMS) - Guangzhou, China (2014.8.6-2014.8.8)] 2014 10th International Conference on Reliability, Maintainability and Safety (ICRMS) - Investigation of pulse thermal resistance of a semiconductor device
Li, Ruguan, Zhou, Bin, Song, Fangfang, Zeng, Chang, Liao, XueyangYear:
2014
Language:
english
DOI:
10.1109/icrms.2014.7107165
File:
PDF, 433 KB
english, 2014