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[IEEE 2008 20th IEEE International Conference on Tools with Artificial Intelligence (ICTAI) - Dayton, OH, USA (2008.11.3-2008.11.5)] 2008 20th IEEE International Conference on Tools with Artificial Intelligence - Image Characterization via Multilayer Neural Networks
Barcelos, Celia A. Z., Ribeiro, Eduardo F., Batista, Marcos A.Year:
2008
Language:
english
DOI:
10.1109/ictai.2008.71
File:
PDF, 5.66 MB
english, 2008