Adaptive Circuit Design Methodology and Test Applied to...

IEEE Design and Test 2014 / 12 Vol. 31; Iss. 6

Adaptive Circuit Design Methodology and Test Applied to Millimeter-Wave Circuits

Plouchart, J.-O, Parker, Benjamin, Sadhu, Bodhisatwa, Valdes-Garcia, Alberto, Friedman, Daniel, Sanduleanu, Mihai, Fa Wang,, Xin Li,, Balteanu, Andreea
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Volume:
31
Language:
english
Journal:
IEEE Design & Test
DOI:
10.1109/mdat.2014.2343192
Date:
December, 2014
File:
PDF, 576 KB
english, 2014
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