[IEEE 2015 IEEE 42nd Photovoltaic Specialists Conference (PVSC) - New Orleans, LA, USA (2015.6.14-2015.6.19)] 2015 IEEE 42nd Photovoltaic Specialist Conference (PVSC) - Depth resolved preferential orientation of Cu(In,Ga)Se2 thin films based on the 112 peak model
Drobiazg, Tomasz, Arzel, Ludovic, Barreau, Nicolas, Zabierowski, PawelYear:
2015
Language:
english
DOI:
10.1109/pvsc.2015.7356102
File:
PDF, 660 KB
english, 2015