[IEEE 1997 International Semiconductor Conference 20th Edition. CAS '97 Proceedings - Sinaia, Romania (7-11 Oct. 1997)] 1997 International Semiconductor Conference 20th Edition. CAS '97 Proceedings - A quantitative analysis of the penetration of SnO/sub 2/ into porous silicon
Gartner, M., Savaniu, C., Parlog, C., Zaharescu, M., Craciun, G., Buiu, O., Szilagy, E., Cobianu, C.Volume:
1
Year:
1997
Language:
english
DOI:
10.1109/smicnd.1997.651552
File:
PDF, 320 KB
english, 1997