[IEEE 2008 International SoC Design Conference (ISOCC) - Busan, Korea (South) (2008.11.24-2008.11.25)] 2008 International SoC Design Conference - DFM optimization of standard cells considering random and systematic defect
Daehyun Jang,, Naya Ha,, Park, Joo-Hyun, Seung-Weon Paek,, Hyo-Sig Won,, Kyu-Myung Choi,Year:
2008
Language:
english
DOI:
10.1109/socdc.2008.4815575
File:
PDF, 111 KB
english, 2008