[IEEE International Test Conference, 2003. ITC 2003. - Washington, DC, USA (Sept. 30-Oct. 2, 2003)] International Test Conference, 2003. Proceedings. ITC 2003. - A new maximal diagnosis algorithm for bus-structured systems
YongJoon Kim,, DongSub Song,, YongSeung Shin,, Sunghoon Chun,, Sungho Kang,Volume:
1
Year:
2003
Language:
english
DOI:
10.1109/test.2003.1270857
File:
PDF, 820 KB
english, 2003