[IEEE 2006 IEEE International Test Conference - Santa Clara, CA, USA (2006.10.22-2006.10.27)] 2006 IEEE International Test Conference - Classifying Bad Chips and Ordering Test Sets
Ferhani, Francois-fabien, McCluskey, EdwardYear:
2006
Language:
english
DOI:
10.1109/test.2006.297736
File:
PDF, 187 KB
english, 2006