[IEEE 2015 IEEE International Test Conference (ITC) - Anaheim, CA, USA (2015.10.6-2015.10.8)] 2015 IEEE International Test Conference (ITC) - A new method for measuring alias-free aperture jitter in an ADC output
Yamaguchi, Takahiro J., Degawa, Katsuhiko, Kawabata, Masayuki, Ishida, Masahiro, Uekusa, Kouichiro, Soma, ManiYear:
2015
Language:
english
DOI:
10.1109/test.2015.7342384
File:
PDF, 434 KB
english, 2015