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[IEEE 2002 IEEE International Ultrasonics Symposium - Munich, Germany (8-11 Oct. 2002)] 2002 IEEE Ultrasonics Symposium, 2002. Proceedings. - SAW reflection characteristics of Cu electrodes and their application to SAW IF devices
Omori, T., Nakagomi, S., Tanaka, H., Asano, H., Hashimoto, K.Y., Yamaguchi, M.Year:
2002
Language:
english
DOI:
10.1109/ultsym.2002.1193344
File:
PDF, 361 KB
english, 2002