[IEEE 2015 IEEE 33rd VLSI Test Symposium (VTS) - Napa, CA, USA (2015.4.27-2015.4.29)] 2015 IEEE 33rd VLSI Test Symposium (VTS) - Special session 8C: E.J. McCluskey doctoral thesis award semi-final
Portolan, M., Huang, K.Year:
2015
Language:
english
DOI:
10.1109/vts.2015.7116285
File:
PDF, 121 KB
english, 2015