In situ analysis using synchrotron radiation...

Surface and Interface Analysis 2015 / 04 Vol. 47; Iss. 4

In situ analysis using synchrotron radiation photoemission spectroscopy for initial oxidation of oxygen preadsorbed Si(001) surfaces induced by supersonic O 2 molecular beams

Yoshigoe, Akitaka, Teraoka, Yuden
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Volume:
47
Language:
english
Journal:
Surface and Interface Analysis
DOI:
10.1002/sia.5725
Date:
April, 2015
File:
PDF, 27 KB
english, 2015
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