Obstacle strength of binary junction due to dislocation dipole formation: An in-situ transmission electron microscopy study
Hafez Haghighat, S.M., Schäublin, R.Volume:
465
Language:
english
Journal:
Journal of Nuclear Materials
DOI:
10.1016/j.jnucmat.2015.06.054
Date:
October, 2015
File:
PDF, 710 KB
english, 2015