Obstacle strength of binary junction due to dislocation...

Obstacle strength of binary junction due to dislocation dipole formation: An in-situ transmission electron microscopy study

Hafez Haghighat, S.M., Schäublin, R.
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Volume:
465
Language:
english
Journal:
Journal of Nuclear Materials
DOI:
10.1016/j.jnucmat.2015.06.054
Date:
October, 2015
File:
PDF, 710 KB
english, 2015
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