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[IEEE 2015 IEEE AUTOTESTCON - National Harbor, MD, USA (2015.11.2-2015.11.5)] 2015 IEEE AUTOTESTCON - Fault propagation characteristics analysis for large-scale electronic system by hierarchical signed directed graph
Yang, Zhiming, Zhang, Chengcheng, Zhuang Liu, Min, Yu, Yang, Qiao, Liyan, Peng, XiyuanYear:
2015
Language:
english
DOI:
10.1109/autest.2015.7356492
File:
PDF, 2.20 MB
english, 2015