[IEEE 2015 IEEE International Conference on Electron...

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[IEEE 2015 IEEE International Conference on Electron Devices and Solid-State Circuits (EDSSC) - Singapore, Singapore (2015.6.1-2015.6.4)] 2015 IEEE International Conference on Electron Devices and Solid-State Circuits (EDSSC) - Investigation of low temperature Cu/In bonding in 3D integration

Hsieh, Yu-Sheng, Shen, Ting-Ting, Chien, Yu-San, Chen, Kuan-Neng, Shinozaki, Yuko, Kawasaki, Naohiko
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Year:
2015
DOI:
10.1109/edssc.2015.7285131
File:
PDF, 675 KB
2015
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