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[IEEE 2014 IEEE 28th Convention of Electrical & Electronics Engineers in Israel (IEEEI) - Eilat, Israel (2014.12.3-2014.12.5)] 2014 IEEE 28th Convention of Electrical & Electronics Engineers in Israel (IEEEI) - An analytical calculation of the silicon limit for two dimensional RESURF drift layers
Awad, Morad, Shapira, ShyeYear:
2014
Language:
english
DOI:
10.1109/eeei.2014.7005853
File:
PDF, 248 KB
english, 2014