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[IEEE 2015 IEEE International Instrumentation and Measurement Technology Conference (I2MTC) - Pisa, Italy (2015.5.11-2015.5.14)] 2015 IEEE International Instrumentation and Measurement Technology Conference (I2MTC) Proceedings - Digital pathology: Identifying spongiosis in unstained histopathology specimen
Abeysekera, Sanush, Kar, Nicholas, Siew, Wei, Po-Leen Ooi, Melanie, Kuang, Ye Chow, Syed Hassan, Sharifah, Demidenko, SergeYear:
2015
Language:
english
DOI:
10.1109/i2mtc.2015.7151584
File:
PDF, 1.42 MB
english, 2015