[IEEE 2014 IEEE/ACM International Conference on Computer-Aided Design (ICCAD) - San Jose, CA, USA (2014.11.2-2014.11.6)] 2014 IEEE/ACM International Conference on Computer-Aided Design (ICCAD) - Sensorless estimation of global device-parameters based on Fmax testing
Shintani, Michihiro, Sato, TakashiYear:
2014
Language:
english
DOI:
10.1109/iccad.2014.7001397
File:
PDF, 1.23 MB
english, 2014