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[IEEE 5th International Conference on Properties and Applications of Dielectric Materials - Seoul, South Korea (25-30 May 1997)] Proceedings of 5th International Conference on Properties and Applications of Dielectric Materials - Reliability of microcircuits through partial discharge measurements
Wahidabanu, R.S.D., Panneer Selvam, M.A., Udayakumar, K.Volume:
1
Year:
1997
Language:
english
DOI:
10.1109/icpadm.1997.617584
File:
PDF, 152 KB
english, 1997