[IEEE 7th International Conference on Solid-State and Integrated Circuits Technology, 2004. - Beijing, China (Oct. 18-21, 2004)] Proceedings. 7th International Conference on Solid-State and Integrated Circuits Technology, 2004. - Conductivity to first SBD of a stress induced leakage path in ultrathin thermal oxides
Mingzhen Xu,, Changhua Tan,, Yandong He,Том:
2
Рік:
2004
Мова:
english
DOI:
10.1109/icsict.2004.1436622
Файл:
PDF, 743 KB
english, 2004
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