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[IEEE IEEE International Conference on Systems, Man, and Cybernetics - Nashville, TN, USA (8-11 Oct. 2000)] SMC 2000 Conference Proceedings. 2000 IEEE International Conference on Systems, Man and Cybernetics. 'Cybernetics Evolving to Systems, Humans, Organizations, and their Complex Interactions' (Cat. No.00CH37166) - A statistical approach for textile fault detection
Abouelela, A., Abbas, I., El deeb, I., Nassar, S.Volume:
4
Year:
2000
Language:
english
DOI:
10.1109/icsmc.2000.884431
File:
PDF, 549 KB
english, 2000