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[IEEE Twenty Seventh Annual IEEE/CPMT/SEMI International Electronics Manufacturing Technology Symposium - San Jose, CA, USA (17-18 July 2002)] 27th Annual IEEE/SEMI International Electronics Manufacturing Technology Symposium - Bringing test to design: testing in the designer's event based environment
Rajsuman, R.Year:
2002
Language:
english
DOI:
10.1109/iemt.2002.1032781
File:
PDF, 322 KB
english, 2002