[IEEE 2015 IEEE International Reliability Physics Symposium (IRPS) - Monterey, CA, USA (2015.4.19-2015.4.23)] 2015 IEEE International Reliability Physics Symposium - High voltage robustness of mold compounds under different environmental conditions
Paye, Julie, Claudi, Albert, Stecher, MatthiasYear:
2015
Language:
english
DOI:
10.1109/irps.2015.7112792
File:
PDF, 937 KB
english, 2015