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[IEEE 2014 55th International Scientific Conference on Power and Electrical Engineering of Riga Technical University (RTUCON) - Riga, Latvia (2014.10.14-2014.10.14)] 2014 55th International Scientific Conference on Power and Electrical Engineering of Riga Technical University (RTUCON) - Mechanism analysis of DC bias increasing risk of commutation failure
Deng, Wanting, Luo, Yayun, Quan, Jiangtao, Guo, Qianwen, Tong, Chongli, Wei, Fanrong, Wang, Zhicheng, Ding, Suyang, Zhou, Youbin, Li, Zhengtian, Lin, Xiangning, Sun, JinwenYear:
2014
Language:
english
DOI:
10.1109/rtucon.2014.6998201
File:
PDF, 261 KB
english, 2014