[IEEE 2015 31st Thermal Measurement, Modeling & Management Symposium (SEMI-THERM) - San Jose, CA, USA (2015.3.15-2015.3.19)] 2015 31st Thermal Measurement, Modeling & Management Symposium (SEMI-THERM) - Thermal performance and reliability assessment of nano-sintered silver die attach materials
Wilcoxon, Ross, Dimke, Mark, Xie, ChenggangYear:
2015
Language:
english
DOI:
10.1109/semi-therm.2015.7100167
File:
PDF, 956 KB
english, 2015