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[IEEE International Test Conference, 2003. ITC 2003. - Washington, DC, USA (Sept. 30-Oct. 2, 2003)] International Test Conference, 2003. Proceedings. ITC 2003. - Detection of resistive shorts in deep sub-micron technologies
Kruseman, B., van den Oetelaar, S.Volume:
1
Year:
2003
Language:
english
DOI:
10.1109/test.2003.1271072
File:
PDF, 1.01 MB
english, 2003