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[IEEE 2015 IEEE International Test Conference (ITC) - Anaheim, CA, USA (2015.10.6-2015.10.8)] 2015 IEEE International Test Conference (ITC) - A structured approach to post-silicon validation and debug using symbolic quick error detection
Lin, David, Singh, Eshan, Barrett, Clark, Mitra, SubhasishYear:
2015
Language:
english
DOI:
10.1109/test.2015.7342397
File:
PDF, 2.07 MB
english, 2015