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Assessing the Cost Effectiveness of Fault Prediction in Acceptance Testing
Monden, Akito, Hayashi, Takuma, Shinoda, Shoji, Shirai, Kumiko, Yoshida, Junichi, Barker, Mike, Matsumoto, KenichiYear:
2014
Language:
english
Journal:
IEEE Transactions on Software Engineering
DOI:
10.1109/tse.2013.23
File:
PDF, 1017 KB
english, 2014