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[IEEE 2015 IFIP/IEEE International Conference on Very Large Scale Integration (VLSI-SoC) - Daejeon, South Korea (2015.10.5-2015.10.7)] 2015 IFIP/IEEE International Conference on Very Large Scale Integration (VLSI-SoC) - Circuit performance optimization for local intra-die process variations using a gate selection metric
Champac, Victor, Reyes, Alejandra Nicte-ha, Gomez, Andres F.Year:
2015
Language:
english
DOI:
10.1109/vlsi-soc.2015.7314410
File:
PDF, 1.40 MB
english, 2015