[IEEE 2015 IEEE 33rd VLSI Test Symposium (VTS) - Napa, CA, USA (2015.4.27-2015.4.29)] 2015 IEEE 33rd VLSI Test Symposium (VTS) - At-Product-Test Dedicated Adaptive supply-resonance suppression
Taniguchi, Kohki, Miura, Noriyuki, Hayashi, Taisuke, Nagata, MakotoYear:
2015
Language:
english
DOI:
10.1109/vts.2015.7116273
File:
PDF, 1.47 MB
english, 2015