CHARACTERIZING LOCALIZED STRAIN OF...

Surface Review and Letters 2016 / 02 Vol. 23; Iss. 1

CHARACTERIZING LOCALIZED STRAIN OF IN0.83Al0.17As/In0.83Ga0.17As DETECTOR USING LOW FREQUENCY ATOMIC FORCE ACOUSTIC MICROSCOPE

SU, WEITAO, DOU, HONGLEI, HUO, DEXUAN, YU, GUOLIN, DAI, NING
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Volume:
23
Language:
english
Journal:
Surface Review and Letters
DOI:
10.1142/S0218625X15501103
Date:
February, 2016
File:
PDF, 1.02 MB
english, 2016
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