[IEEE 2014 51st ACM/EDAC/IEEE Design Automation Conference (DAC) - San Francisco, CA, USA (2014.6.1-2014.6.5)] 2014 51st ACM/EDAC/IEEE Design Automation Conference (DAC) - SLC-enabled wear leveling for MLC PCM considering process variation
Mengying Zhao,, Jiang, Lei, Zhang, Youtao, Xue, Chun JasonYear:
2014
Language:
english
DOI:
10.1109/dac.2014.6881363
File:
PDF, 454 KB
english, 2014