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[IEEE 2015 IEEE 24th Electrical Performance of Electronic Packaging and Systems (EPEPS) - San Jose, CA, USA (2015.10.25-2015.10.28)] 2015 IEEE 24th Electrical Performance of Electronic Packaging and Systems (EPEPS) - Global sensitivity based dimension reduction for fast variability analysis of nonlinear circuits
Prasad, Aditi Krishna, Roy, SourajeetYear:
2015
Language:
english
DOI:
10.1109/epeps.2015.7347138
File:
PDF, 333 KB
english, 2015