[IEEE 2015 IEEE 20th Conference on Emerging Technologies & Factory Automation (ETFA) - Luxembourg, Luxembourg (2015.9.8-2015.9.11)] 2015 IEEE 20th Conference on Emerging Technologies & Factory Automation (ETFA) - Parameter update and PDF prediction of degradation using stage-based Gamma process
Yan, Heng-Chao, Zhou, Jun-Hong, Pang, Chee Khiang, Li, XiangYear:
2015
Language:
english
DOI:
10.1109/etfa.2015.7301593
File:
PDF, 192 KB
english, 2015