[IEEE Proceedings. Ninth IEEE International High-Level Design Validation and Test Workshop (IEEE Cat. No.04EX940) - Sonoma Valley, CA, USA (2004.11.10-2004.11.12)] Proceedings. Ninth IEEE International High-Level Design Validation and Test Workshop (IEEE Cat. No.04EX940) - ATPG based functional test for data paths: application to a floating point unit
Bayraktaroglu, I., d'Abreu, M.Year:
2004
Language:
english
DOI:
10.1109/hldvt.2004.1431230
File:
PDF, 436 KB
english, 2004