[IEEE IAS '95. Conference Record of the 1995 IEEE Industry Applications Conference Thirtieth IAS Annual Meeting - Orlando, FL, USA (8-12 Oct. 1995)] IAS '95. Conference Record of the 1995 IEEE Industry Applications Conference Thirtieth IAS Annual Meeting - Surface potential measurements for predicting film thickness of electrostatically sprayed powders
Rawski, S.G., Elmoursi, A.A., Ottaviani, R.A., Phuong-Anh Ngo,Volume:
2
Year:
1995
Language:
english
DOI:
10.1109/ias.1995.530449
File:
PDF, 358 KB
english, 1995