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[IEEE 2015 IEEE International Conference on Computer Vision Workshop (ICCVW) - Santiago, Chile (2015.12.7-2015.12.13)] 2015 IEEE International Conference on Computer Vision Workshop (ICCVW) - Coordinated Local Metric Learning
Saxena, Shreyas, Verbeek, JakobYear:
2015
Language:
english
DOI:
10.1109/iccvw.2015.56
File:
PDF, 882 KB
english, 2015