[IEEE 2004 International Conference on Machine Learning and Cybernetics - Shanghai, China (26-29 Aug. 2004)] Proceedings of 2004 International Conference on Machine Learning and Cybernetics (IEEE Cat. No.04EX826) - Spatial styles capturing using genetic algorithms in sketch understanding
Li-Sha Zhang,, Zheng-Xing Sun,, Man-Wu Lee,, Wei Jiang,Volume:
6
Year:
2004
Language:
english
DOI:
10.1109/icmlc.2004.1380431
File:
PDF, 447 KB
english, 2004