[IEEE 2015 First International Conference on Reliability Systems Engineering (ICRSE) - Beijing, China (2015.10.21-2015.10.23)] 2015 First International Conference on Reliability Systems Engineering (ICRSE) - Reliability assessement method based on SVDD and SVR with multiple performances degradation data for chassis system
Zhang, Lixia, Feng, Fuzhou, Bi, MingguangYear:
2015
Language:
english
DOI:
10.1109/icrse.2015.7366455
File:
PDF, 235 KB
english, 2015