[IEEE 2014 9th International Design & Test Symposium (IDT) - Algeries, Algeria (2014.12.16-2014.12.18)] 2014 9th International Design and Test Symposium (IDT) - Investigation of defect microstructures responsible for NBTI degradation using effective dipole moment extraction
Tahi, Hakim, Djezzar, Boualem, Benmassai, Karim, Boubaaya, Mohamed, Benabdelmoumene, Abdelmadjid, Chenouf, Amel, Goudjil, MohamedYear:
2014
Language:
english
DOI:
10.1109/idt.2014.7038620
File:
PDF, 440 KB
english, 2014