[IEEE 2014 9th International Design & Test Symposium...

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[IEEE 2014 9th International Design & Test Symposium (IDT) - Algeries, Algeria (2014.12.16-2014.12.18)] 2014 9th International Design and Test Symposium (IDT) - Investigation of defect microstructures responsible for NBTI degradation using effective dipole moment extraction

Tahi, Hakim, Djezzar, Boualem, Benmassai, Karim, Boubaaya, Mohamed, Benabdelmoumene, Abdelmadjid, Chenouf, Amel, Goudjil, Mohamed
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Year:
2014
Language:
english
DOI:
10.1109/idt.2014.7038620
File:
PDF, 440 KB
english, 2014
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