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[IEEE IECON 2015 - 41st Annual Conference of the IEEE Industrial Electronics Society - Yokohama (2015.11.9-2015.11.12)] IECON 2015 - 41st Annual Conference of the IEEE Industrial Electronics Society - Detection of elevated regions in surface images from laser beam melting processes
zur Jacobsmuhlen, Joschka, Kleszczynski, Stefan, Witt, Gerd, Merhof, DoritYear:
2015
Language:
english
DOI:
10.1109/iecon.2015.7392275
File:
PDF, 1.12 MB
english, 2015