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[IEEE 2014 IEEE 36th International Electronics Manufacturing Technology Conference (IEMT) - Johor, Malaysia (2014.11.11-2014.11.13)] 36th International Electronics Manufacturing Technology Conference - Modeling investigation of the influence of polycrystalline grain size on the electrical characteristics of polysilicon diode and resistor
Seng, Joseph Ke KianYear:
2014
Language:
english
DOI:
10.1109/iemt.2014.7123082
File:
PDF, 1.59 MB
english, 2014