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[IEEE 2004 International Symposium on Electromagnetic Compatibility - Silicon Valley, CA, USA (9-13 Aug. 2004)] 2004 International Symposium on Electromagnetic Compatibility (IEEE Cat. No.04CH37559) - Radiated emissions from populated printed circuit boards due to power bus noise

Shim, H., Fu, Y., Hubing, T.
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Volume:
2
Year:
2004
Language:
english
DOI:
10.1109/isemc.2004.1349824
File:
PDF, 368 KB
english, 2004
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